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Proceedings Paper

Refractive index inversion based on Mueller matrix method
Author(s): Huaxi Fan; Wenyuan Wu; Yanhua Huang; Zhaozhao Li
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Paper Abstract

Based on Stokes vector and Jones vector, the correlation between Mueller matrix elements and refractive index was studied with the result simplified, and through Mueller matrix way, the expression of refractive index inversion was deduced. The Mueller matrix elements, under different incident angle, are simulated through the expression of specular reflection so as to analyze the influence of the angle of incidence and refractive index on it, which is verified through the measure of the Mueller matrix elements of polished metal surface. Research shows that, under the condition of specular reflection, the result of Mueller matrix inversion is consistent with the experiment and can be used as an index of refraction of inversion method, and it provides a new way for target detection and recognition technology.

Paper Details

Date Published: 8 March 2017
PDF: 8 pages
Proc. SPIE 10255, Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016, 102553N (8 March 2017); doi: 10.1117/12.2267696
Show Author Affiliations
Huaxi Fan, The PLA Univ. of Science and Technology (China)
Wenyuan Wu, The PLA Univ. of Science and Technology (China)
Yanhua Huang, The PLA Univ. of Science and Technology (China)
Zhaozhao Li, The PLA Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 10255:
Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016
Yueguang Lv; Jialing Le; Hesheng Chen; Jianyu Wang; Jianda Shao, Editor(s)

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