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Proceedings Paper

Spatially resolved spectroscopy for direct-contacted dielectric layers using time-domain interferometry
Author(s): Ryoma Onita; Syohei Gunji; Tatsutoshi Shioda
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Paper Abstract

We propose a novel spectroscopy by combining Kramers-Kronig analysis and OCT. It can realize the non-contact measurement to resolve the spectra of the direct-contacted dielectric layers as color tomography, which we call spatially-resolved spectroscopy. In this paper, we simulate the proposed method that can be applied to the measurement of the amplitude reflectance spectrum using a glass plate on normal incident condition. As a demonstration, the glass sample was experimentally observed by TD-OCT and applied to K-K analysis. The result indicated that the proposed method is achievable to the spatially resolved spectroscopy for direct-contacted dielectric multilayers.

Paper Details

Date Published:
Proc. SPIE 10323, 25th International Conference on Optical Fiber Sensors, ; doi: 10.1117/12.2267472
Show Author Affiliations
Ryoma Onita, Saitama Univ. (Japan)
Syohei Gunji, Saitama Univ. (Japan)
Tatsutoshi Shioda, Saitama Univ. (Japan)

Published in SPIE Proceedings Vol. 10323:
25th International Conference on Optical Fiber Sensors
Youngjoo Chung; Wei Jin; Byoungho Lee; John Canning; Kentaro Nakamura; Libo Yuan, Editor(s)

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