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Proceedings Paper

UV focal plane array device relative spectral response measurement technology research
Author(s): HongYuan Liu; ChengPing Ying; Hongchao Wang; Hengfei Wang; Xueshun Shi; Bin Wu; Bin Jiang
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Paper Abstract

Spectral response is one of the important technological parameters of the detector, along with the development of the ultraviolet detector technology, accurate measurement of UV detector spectral responsivity is becoming more and more important. This paper analyzes the ultraviolet focal plane array relative spectral responsivity measurement principle, using the substitution method of measuring ultraviolet focal plane array detector relative spectral responsivity, and established a calibration device for relative spectral response of UV focal plane array. The relative spectral response of UV focal plane array device was obtained,can be seen from the curves, UV focal plane array device from 250 nm to 290 nm spectral response range, the peak response near 270 nm, Show that the array sun-blind characteristic of a device. The uncertainty of analysis results showed that UV focal plane array device relative spectral response measurement uncertainty of calibration device is about 3.6%, can meet the demand of high precision measurement.

Paper Details

Date Published: 8 March 2017
PDF: 6 pages
Proc. SPIE 10255, Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016, 102553E (8 March 2017); doi: 10.1117/12.2267422
Show Author Affiliations
HongYuan Liu, The 41st Institute of China Electronics Technology Group Corp. (China)
ChengPing Ying, The 41st Institute of China Electronics Technology Group Corp. (China)
Hongchao Wang, The 41st Institute of China Electronics Technology Group Corp. (China)
Hengfei Wang, The 41st Institute of China Electronics Technology Group Corp. (China)
Xueshun Shi, The 41st Institute of China Electronics Technology Group Corp. (China)
Science and Technology on Electronic Test and Measurement Lab. (China)
Bin Wu, The 41st Institute of China Electronics Technology Group Corp. (China)
Science and Technology on Electronic Test and Measurement Lab. (China)
Bin Jiang, The 41st Institute of China Electronics Technology Group Corp. (China)


Published in SPIE Proceedings Vol. 10255:
Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016
Yueguang Lv; Jialing Le; Hesheng Chen; Jianyu Wang; Jianda Shao, Editor(s)

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