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Proceedings Paper

A simple calculation method for heavy ion induced soft error rate in space environment
Author(s): A. M. Galimov; I. V. Elushov; G. I. Zebrev
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Paper Abstract

In this paper based on the new parameterization shape, an alternative heavy ion induced soft errors characterization approach is proposed and validated. The method provides an unambiguous calculation procedure to predict an upset rate in highly-scaled memory in a space environment.

Paper Details

Date Published: 30 December 2016
PDF: 6 pages
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022414 (30 December 2016); doi: 10.1117/12.2267145
Show Author Affiliations
A. M. Galimov, National Research Nuclear Univ. MEPhI (Russian Federation)
I. V. Elushov, National Research Nuclear Univ. MEPhI (Russian Federation)
G. I. Zebrev, National Research Nuclear Univ. MEPhI (Russian Federation)


Published in SPIE Proceedings Vol. 10224:
International Conference on Micro- and Nano-Electronics 2016
Vladimir F. Lukichev; Konstantin V. Rudenko, Editor(s)

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