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Proceedings Paper

Multi-view phase unwrapping with composite fringe patterns
Author(s): Tianyang Tao; Qian Chen; Yuzhen Zhang; Yan Hu; Jian Da; Chao Zuo
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Paper Abstract

We introduce a high-speed 3-D shape measurement technique based on composite phase-shifting fringes and a stereo camera system. Epipolar constraint is adopted to search the corresponding point independently without additional images. Meanwhile, by analysing the 3-D position and the main wrapped phase of the corresponding point, pairs with an incorrect 3-D position or considerable phase difference are effectively rejected. Then all the qualified corresponding points are corrected, and the unique one as well as the related period order is selected through the embedded triangular wave. Finally, considering that some points can only be captured by a single camera in some shading areas, the final period order of these points in one camera and the one of their corresponding points in another camera always have different values, so left-right consistency check is employed to eliminate those erroneous period orders in this case. Several experiments on both static and dynamic scenes are performed, verifying that our method can achieve a speed of 120 frames per second (fps) with 25-period fringe patterns for fast, dense, and accurate 3-D measurement.

Paper Details

Date Published: 10 February 2017
PDF: 6 pages
Proc. SPIE 10250, International Conference on Optical and Photonics Engineering (icOPEN 2016), 1025017 (10 February 2017); doi: 10.1117/12.2267078
Show Author Affiliations
Tianyang Tao, Nanjing Univ. of Science and Technology (China)
Qian Chen, Nanjing Univ. of Science and Technology (China)
Yuzhen Zhang, Nanjing Univ. of Science and Technology (China)
Yan Hu, Nanjing Univ. of Science and Technology (China)
Jian Da, Nanjing Univ. of Science and Technology (China)
Chao Zuo, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 10250:
International Conference on Optical and Photonics Engineering (icOPEN 2016)
Anand Krishna Asundi; Xiyan Huang; Yi Xie, Editor(s)

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