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Proceedings Paper

Quantum states tomography with noisy measurement channels
Author(s): Yu. I. Bogdanov; B. I. Bantysh; N. A. Bogdanova; A. B. Kvasnyy; V. F. Lukichev
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Paper Abstract

We consider realistic measurement systems, where measurements are accompanied by decoherence processes. The aim of this work is the construction of methods and algorithms for precise quantum measurements with fidelity close to the fundamental limit. In the present work the notions of ideal and non-ideal quantum measurements are strictly formalized. It is shown that non-ideal quantum measurements could be represented as a mixture of ideal measurements. Based on root approach the quantum state reconstruction method is developed. Informational accuracy theory of non-ideal quantum measurements is proposed. The monitoring of the amount of information about the quantum state parameters is examined, including the analysis of the information degradation under the noise influence. The study of achievable fidelity in non-ideal quantum measurements is performed. The results of simulation of fidelity characteristics of a wide class of quantum protocols based on polyhedrons geometry with high level of symmetry are presented. The impact of different decoherence mechanisms, including qubit amplitude and phase relaxation, bit-flip and phase-flip, is considered.

Paper Details

Date Published: 30 December 2016
PDF: 10 pages
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242O (30 December 2016); doi: 10.1117/12.2267029
Show Author Affiliations
Yu. I. Bogdanov, Institute of Physics and Technology (Russian Federation)
National Research Univ. of Electronic Technology MIET (Russian Federation)
National Research Nuclear Univ. MEPHI (Russian Federation)
B. I. Bantysh, Institute of Physics and Technology (Russian Federation)
National Research Univ. of Electronic Technology MIET (Russian Federation)
N. A. Bogdanova, Institute of Physics and Technology (Russian Federation)
National Research Univ. of Electronic Technology MIET (Russian Federation)
A. B. Kvasnyy, Institute of Physics and Technology (Russian Federation)
National Research Nuclear Univ. MEPHI (Russian Federation)
V. F. Lukichev, Institute of Physics and Technology (Russian Federation)


Published in SPIE Proceedings Vol. 10224:
International Conference on Micro- and Nano-Electronics 2016
Vladimir F. Lukichev; Konstantin V. Rudenko, Editor(s)

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