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Proceedings Paper

Diamond chip under single-photon driving as a high spatial resolution quantum magnetometer and electrometer
Author(s): Alexander V. Tsukanov; Igor Yu. Kateev
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Paper Abstract

The problem of practical realization of a compact sensing device with high-spatial resolution is addressed. The principle of external field measuring uses analysis of transmission or reflection spectra from a diamond microstructure composed of three-microring optical resonators. Due to Zeeman and Stark shifts of energy levels of NV-centers formed in the microring edge the hybrid electron-photon spectrum changes depending on the strength and direction of magnetic and electric fields, respectively. A probe laser with a tunable wavelength excites the structure in a single-photon regime and its response enables one to detect the fields via spectral behavior. The model of the sensor dynamics accounts for both coherent driving and incoherent processes (center relaxation, dephasing and photon leakage) in terms of Lindblad formalism. With use of the finite-difference time-domain numerical method a three-ring spectrum is calculated and eigenmodes close to NV-center zero-phonon line are found. Electromagnetic field shows whispering-gallery behavior, so NV-center is coupled to a common three-ring mode antinode. As we show in the steady-state regime our approach gives the possibility of external fields measuring in a large intensity range with high sensitivity.

Paper Details

Date Published: 30 December 2016
PDF: 13 pages
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242H (30 December 2016); doi: 10.1117/12.2266858
Show Author Affiliations
Alexander V. Tsukanov, Institute of Physics and Technology (Russian Federation)
Moscow Institute of Physics and Technology (Russian Federation)
Igor Yu. Kateev, Institute of Physics and Technology (Russian Federation)
Moscow Institute of Physics and Technology (Russian Federation)


Published in SPIE Proceedings Vol. 10224:
International Conference on Micro- and Nano-Electronics 2016
Vladimir F. Lukichev; Konstantin V. Rudenko, Editor(s)

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