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Proceedings Paper

Single photon detector design features
Author(s): Sergey V. Zaitsev; Vladimir L. Kurochkin; Yury V. Kurochkin
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Paper Abstract

In the report are discussed the laboratory test results of SPAD detectors with InGaAs / InP avalanche photodiodes, operating in Geiger mode. Device operating in synchronous mode with the dead timer setting for proper working conditions of photodiodes. The report materials will showing the functional block diagram of the detector, real operating signals in the receiver path and clock circuits and main results of measurements. The input signal of the synchronous detector is the clock, which determines the time positions of expected photons arrival. Increasing the clock speed 1-300 MHz or getting more time positions of the time grid, we provide increased capacity for time position code of signals, when QKD information transmitted over the nets. At the same time, the maximum attainable speed of photon reception is limited by diode dead time. Diode quantum noise are minimized by inclusion of a special time interval – dead time 0.1-10 usec, after each received and registered a photon. The lowest attainable value of the dead time is determined as a compromise between transients in electrical circuits, passive avalanche «quenching» circuit and thermal transients cooling crystal diode, after each avalanche pass though photodiode. Achievable time and speed parameters are discussed with specific examples of detectors.

Paper Details

Date Published: 30 December 2016
PDF: 9 pages
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242V (30 December 2016); doi: 10.1117/12.2266847
Show Author Affiliations
Sergey V. Zaitsev, International Ctr. for Quantum Optics & Quantum Technologies Limited Liability Co. (Russian Federation)
Femto Vision LLC (Russian Federation)
Vladimir L. Kurochkin, International Ctr. for Quantum Optics & Quantum Technologies Limited Liability Co. (Russian Federation)
Yury V. Kurochkin, International Ctr. for Quantum Optics & Quantum Technologies Limited Liability Co. (Russian Federation)


Published in SPIE Proceedings Vol. 10224:
International Conference on Micro- and Nano-Electronics 2016
Vladimir F. Lukichev; Konstantin V. Rudenko, Editor(s)

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