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Proceedings Paper

On bit-depth of pattern in three-dimensional measurement system based on digital fringe projection
Author(s): Yong Li; Jinbiao Chen; Yanshuai Tu; Hui Wang
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Paper Abstract

Fringe pattern can be projected fast by digital projector using DLP technology. The projection speed is higher when patterns with lower bit-depth are adopted. The phase error of sinusoidal fringe pattern with different bit-depth is studied with three-step phase-shifting algorithm. The uniform quantization algorithm (UQA) and quantization algorithm with error diffusion (EDA) are used for pattern quantization. The conclusions are as following. 1) With UQA, the maximum of phase error will less than 1% of 2π when bit-depth is higher than 4 bits. If the projector is defocused, the error will be decreased. 2) With EDA, the maximum of phase error is larger than that with UQA. But the error will be decreased significantly when the projector is defocused. The phase error of pattern with EDA is smaller than that of pattern with UQA when the projector is nearly focused and the period of pattern is long (for example longer than 20 pixels). If the period of pattern is short, the performance of UQA is always better. 3) The error difference of UQA and EDA will be very small when the bit-depth is higher than 4 bits.

Paper Details

Date Published: 10 February 2017
PDF: 5 pages
Proc. SPIE 10250, International Conference on Optical and Photonics Engineering (icOPEN 2016), 1025018 (10 February 2017); doi: 10.1117/12.2266740
Show Author Affiliations
Yong Li, Zhejiang Provincial Key Lab. of Optical Information Detecting and Display Technology (China)
Zhejiang Normal Univ. (China)
Jinbiao Chen, TaiZhou Univ. (China)
Yanshuai Tu, Zhejiang Provincial Key Lab. of Optical Information Detecting and Display Technology (China)
Zhejiang Normal Univ. (China)
Hui Wang, Zhejiang Provincial Key Lab. of Optical Information Detecting and Display Technology (China)
Zhejiang Normal Univ. (China)


Published in SPIE Proceedings Vol. 10250:
International Conference on Optical and Photonics Engineering (icOPEN 2016)
Anand Krishna Asundi; Xiyan Huang; Yi Xie, Editor(s)

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