Share Email Print
cover

Proceedings Paper

Current calibration algorithm for bolometer-type uncooled infrared image sensor using pipeline signal processing
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this paper, we propose a pixel averaging current calibration algorithm for reducing fixed pattern noise due to the deviation of bolometer resistance. To reduce fixed pattern noise (FPN), averaging current calibration algorithm by which output current of each bolometer reference pixel is averaged by the averaging current calibration is suggested. The principle of algorithm is that average dark current of reference pixel array is subtracted by a dark current of each active pixel array. After that, the current difference with information of pixel deviation is converted to voltage signal through signal processing. To control the current difference of pixel deviation, a proper calibration current is required. Through this calibration algorithm, nano-ampere order dark currents with small deviations can be obtained. Sensor signal processing is based on a pipeline technique which results in parallel processing leading to very high operation. The proposed calibration algorithm has been implemented by a chip which is consisted of a bolometer active pixel array, a bolometer reference pixel array, average current generators, line memories, buffer memories, current-to-voltage converters (IVCs), a digital-to-analog converters (DACs), and analog-to-digital converters (ADCs). Proposed bolometerresistor pixel array and readout circuit has been simulated and fabricated by 0.35μm standard CMOS process.

Paper Details

Date Published: 28 April 2017
PDF: 6 pages
Proc. SPIE 10209, Image Sensing Technologies: Materials, Devices, Systems, and Applications IV, 102091B (28 April 2017); doi: 10.1117/12.2266431
Show Author Affiliations
Sang-Hwan Kim, Kyungpook National Univ. (Korea, Republic of)
Byoung-Soo Choi, Kyungpook National Univ. (Korea, Republic of)
Chang-Woo Oh, Kyungpook National Univ (Korea, Republic of)
Jang-Kyoo Shin, Kyungpook National Univ. (Korea, Republic of)
Jae-Hyun Park, Korea Electronics Technology Institute (Korea, Republic of)
Kyoung-Il Lee, Korea Electronics Technology Institute (Korea, Republic of)


Published in SPIE Proceedings Vol. 10209:
Image Sensing Technologies: Materials, Devices, Systems, and Applications IV
Nibir K. Dhar; Achyut K. Dutta, Editor(s)

© SPIE. Terms of Use
Back to Top