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Proceedings Paper

The influence of subsurface damage’s micro crack on the optical properties of the optical components
Author(s): Huapan Xiao; Hongfeng Chen; Hairong Wang; Guanglong Fu; Zhi Chen
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Paper Abstract

The subsurface damage (SSD) introduced by manufacturing procedures are the important factors affecting mechanical and optical properties of the high-precision optical components. In this paper, we investigated the relationships between the size of SSD’s micro crack and optical properties by studying on the influence of grinding process parameters (average abrasive size, grinding force, wheel speed, grinding depth) on the optical properties (transmittance, absorbance, reflectance) of high-precision optical components first, and then determining the micro crack’s size under the grinding process parameters. Results indicate that with the increase of average abrasive size, grinding force or grinding depth, the transmittance of high-precision optical components decreases while the absorbance and reflectance increase. However, as the wheel speed increases, the transmittance of high-precision optical components increases while the absorbance and the reflectance decrease. Combining these results with the influence of grinding process parameters on the size of micro crack, it can be found that with the increase of micro crack’s size, the transmittance will decrease, while the absorbance and the reflectance will increase.

Paper Details

Date Published: 8 March 2017
PDF: 7 pages
Proc. SPIE 10255, Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016, 1025510 (8 March 2017); doi: 10.1117/12.2266251
Show Author Affiliations
Huapan Xiao, Xi'an Jiaotong Univ. (China)
Hongfeng Chen, Xi'an Jiaotong Univ. (China)
Hairong Wang, Xi'an Jiaotong Univ. (China)
Guanglong Fu, Xi'an Jiaotong Univ. (China)
Zhi Chen, Xi'an Jiaotong Univ. (China)


Published in SPIE Proceedings Vol. 10255:
Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016
Yueguang Lv; Jialing Le; Hesheng Chen; Jianyu Wang; Jianda Shao, Editor(s)

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