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Proceedings Paper

IR and visible BSDF measurements of several materials
Author(s): Marvin L. Bernt; John C. Stover
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Paper Abstract

BSDF measurements are made on a large variety of materials at TMA’s measurement facility. Typical BSDF for many of these materials is not available in literature. This paper gives scatter data at several wavelengths for samples that we believe will be of interest to the scatter community and outlines the techniques and considerations required for some of the more difficult measurements. Included are some very low scatter optics, an off axis parabola and several different window materials.

Paper Details

Date Published: 1 December 1990
PDF: 9 pages
Proc. SPIE 1331, Stray Radiation in Optical Systems, (1 December 1990); doi: 10.1117/12.22661
Show Author Affiliations
Marvin L. Bernt, TMA Technologies, Inc. (United States)
John C. Stover, TMA Technologies, Inc. (United States)

Published in SPIE Proceedings Vol. 1331:
Stray Radiation in Optical Systems
Robert P. Breault, Editor(s)

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