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Proceedings Paper

A hard x-ray split-and-delay unit for the HED instrument at the European XFEL
Author(s): Sebastian Roling; Victor Kärcher; Liubov Samoylova; Karen Appel; Stefan Braun; Peter Gawlitza; Frank Siewert; Ulf Zastrau; Matthias Rollnik; Frank Wahlert; Helmut Zacharias
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Paper Abstract

For the High Energy Density Instrument (HED) at the European XFEL a hard x-ray split-and-delay unit (SDU) is built covering photon energies in the range between 5 keV and 24 keV. This SDU enables time-resolved x-ray pump / x-ray probe experiments as well as sequential diffractive imaging on a femtosecond to picosecond time scale. The set-up is based on wavefront splitting that has successfully been implemented at an autocorrelator at FLASH. The x-ray FEL pulses will be split by a sharp edge of a silicon mirror coated with Mo/B4C and W/B4C multilayers. Both partial beams then pass variable delay lines. For different photon energies the angle of incidence onto the multilayer mirrors is adjusted in order to match the Bragg condition. Hence, maximum delays between +/- 1 ps at 24 keV and up to +/- 23 ps at 5 keV will be possible. Time-dependent wave-optics simulations are performed with Synchrotron Radiation Workshop (SRW) software. The XFEL radiation is simulated using the output of the time-dependent SASE code FAST. For the simulations diffraction on the edge of the beam-splitter as well as height and slope errors of all eight mirror surfaces are taken into account. The impact of these effects on the ability to focus the beam by means of compound refractive lenses (CRL) is analyzed.

Paper Details

Date Published: 20 June 2017
PDF: 8 pages
Proc. SPIE 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV, 1023713 (20 June 2017); doi: 10.1117/12.2265750
Show Author Affiliations
Sebastian Roling, Westfälische Wilhelms-Univ. Münster (Germany)
Victor Kärcher, Westfälische Wilhelms-Univ. Münster (Germany)
Liubov Samoylova, European XFEL GmbH (Germany)
Karen Appel, European XFEL GmbH (Germany)
Stefan Braun, Fraunhofer IWS Dresden (Germany)
Peter Gawlitza, Fraunhofer IWS Dresden (Germany)
Frank Siewert, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH (Germany)
Ulf Zastrau, European XFEL GmbH (Germany)
Matthias Rollnik, Westfälische Wilhelms-Univ. Münster (Germany)
Frank Wahlert, Westfälische Wilhelms-Univ. Münster (Germany)
Helmut Zacharias, Westfälische Wilhelms-Univ. Münster (Germany)


Published in SPIE Proceedings Vol. 10237:
Advances in X-ray Free-Electron Lasers Instrumentation IV
Thomas Tschentscher; Luc Patthey, Editor(s)

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