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A table top polarimetric facility for the EUV spectral range: implementations and characterization
Author(s): A. E. H. Gaballah; P. Zuppella; Nadeem Ahmed; K. Jimenez; G. Pettinari; A. Gerardino; P. Nicolosi
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Paper Abstract

The EUV reflectometer facility available at the Institute for Photonics and Nanotechnologies-CNR Padua (Italy) has been characterized in terms of Stokes’ parameters at two wavelengths of particular interest for space applications, the hydrogen Lyman alpha at 121.6 nm and 160 nm. The design and the performances of a polarizer based on four gold coated mirrors and coupled with the facility are also described. The whole system consisting of the reflectometer and the polarizer can be used to test mirrors, polarizers and phase retarders in the EUV range by means of the Mueller Matrix formalism, and even to investigate compositions, interfaces and structure of thin films and optical coatings.

Paper Details

Date Published: 31 May 2017
PDF: 10 pages
Proc. SPIE 10235, EUV and X-ray Optics: Synergy between Laboratory and Space V, 102350X (31 May 2017); doi: 10.1117/12.2265592
Show Author Affiliations
A. E. H. Gaballah, Univ. degli Studi di Padova (Italy)
CNR-IFN UoS Padova (Italy)
National Institute for Standards (Egypt)
P. Zuppella, CNR-IFN UoS Padova (Italy)
Nadeem Ahmed, Univ. degli Studi di Padova (Italy)
CNR-IFN UoS Padova (Italy)
K. Jimenez, Univ. degli Studi di Padova (Italy)
CNR-IFN UoS Padova (Italy)
G. Pettinari, Institute for Photonics and Nanotechnologies, CNR-IFN (Italy)
A. Gerardino, Institute for Photonics and Nanotechnologies, CNR-IFN (Italy)
P. Nicolosi, Univ. degli Studi di Padova (Italy)
CNR-IFN UoS Padova (Italy)


Published in SPIE Proceedings Vol. 10235:
EUV and X-ray Optics: Synergy between Laboratory and Space V
René Hudec; Ladislav Pina, Editor(s)

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