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A robust and reliable optical trace oxygen sensor
Author(s): G. R. McDowell; A. S. Holmes-Smith; M. Uttamlal; C. Mitchell; P. H. Shannon
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Paper Abstract

In applications of nitrogen (N2) generation, industrial gas manufacturing and food packaging there is a need to ensure oxygen (O2) is absent from the environment, even at the lowest concentration levels. Therefore, there has been an increased growth in the development of trace O2 parts per million (ppm) sensors over the past decade to detect and quantify the concentration of molecular O2 in the environment whether it be dissolved or gaseous O2. The majority of commercially available trace O2 sensors are based on electrochemical, zirconia and paramagnetic technologies. Here, the development of a luminescence-based optical trace O2 sensor is presented. Luminescence-based sensing is now regarded as one of the best techniques for the detection and quantification of O2. This is due to the high detection sensitivity, no O2 is consumed and there are a vast array of luminescent indicators and sensing platforms (polymers) that can be selected to suit the desired application. The sensor will be shown to operate from -30 °C to +60 °C in the 0–1000 ppm and/or 0–1200 μbar partial pressure of oxygen (ppO2) range and is equipped with temperature and pressure compensation. The luminescence non-depleting principle, sensor specifications and miniaturized nature offers an attractive alternative to other sensing technologies and advantages over other luminescence-based O2 ppm sensors.

Paper Details

Date Published: 16 May 2017
PDF: 11 pages
Proc. SPIE 10231, Optical Sensors 2017, 102310T (16 May 2017); doi: 10.1117/12.2265561
Show Author Affiliations
G. R. McDowell, Glasgow Caledonian Univ. (United Kingdom)
A. S. Holmes-Smith, Glasgow Caledonian Univ. (United Kingdom)
M. Uttamlal, Glasgow Caledonian Univ. (United Kingdom)
C. Mitchell, SST Sensing Ltd (United Kingdom)
P. H. Shannon, SST Sensing Ltd (United Kingdom)


Published in SPIE Proceedings Vol. 10231:
Optical Sensors 2017
Francesco Baldini; Jiri Homola; Robert A. Lieberman, Editor(s)

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