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Proceedings Paper

Dual-core fiber based strain sensor for application in extremely high temperatures
Author(s): Anna Ziolowicz; Lukasz Szostkiewicz; Agnieszka Kolakowska; Beata Bienkowska; Dawid Budnicki; Lukasz Ostrowski; Karol Wysokinski; Tomasz Stanczyk; Janusz Fidelus; Piotr Nasilowski; Tadeusz Tenderenda; Marek Napierala; Pawel Mergo; Tomasz Nasilowski
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Paper Abstract

This paper focuses on the utilization of crosstalk phenomenon to construct an innovative strain sensor. In our experiments, we take advantage of special fiber design and technology of fiber post-processing in order to receive strain sensing areas. We present results, which indicate possibility of achieving strain sensitivity at level of several mε/nm with negligible temperature cross-sensitivity at the same time. Furthermore after coating the sensor with the developed copper and gold coatings, it can be easily applied in extremely high temperature (e.g. 500 – 800 ⁰C) and/or aggressive media applications.

Paper Details

Date Published: 23 April 2017
PDF: 4 pages
Proc. SPIE 10323, 25th International Conference on Optical Fiber Sensors, 103238B (23 April 2017); doi: 10.1117/12.2265537
Show Author Affiliations
Anna Ziolowicz, InPhoTech (Poland)
Warsaw Univ. of Technology (Poland)
Lukasz Szostkiewicz, InPhoTech (Poland)
Warsaw Univ. of Technology (Poland)
Agnieszka Kolakowska, InPhoTech (Poland)
Beata Bienkowska, Polish Ctr. for Photonics and Fibre Optics (Poland)
Dawid Budnicki, InPhoTech (Poland)
Lukasz Ostrowski, Polish Ctr. for Photonics and Fibre Optics (Poland)
Karol Wysokinski, InPhoTech (Poland)
Tomasz Stanczyk, InPhoTech (Poland)
Janusz Fidelus, InPhoTech (Poland)
Piotr Nasilowski, InPhoTech (Poland)
Tadeusz Tenderenda, InPhoTech (Poland)
Marek Napierala, InPhoTech (Poland)
Warsaw Univ. of Technology (Poland)
Pawel Mergo, Marie Curie-Sklodowska Univ. (Poland)
Tomasz Nasilowski, InPhoTech (Poland)


Published in SPIE Proceedings Vol. 10323:
25th International Conference on Optical Fiber Sensors
Youngjoo Chung; Wei Jin; Byoungho Lee; John Canning; Kentaro Nakamura; Libo Yuan, Editor(s)

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