Share Email Print
cover

Proceedings Paper

Total electron count variability and stratospheric ozone effects on solar backscatter and LWIR emissions
Author(s): John S. Ross; Steven T. Fiorino
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The development of an accurate ionospheric Total Electron Count (TEC) model is of critical importance to high frequency (HF) radio propagation and satellite communications. However, the TEC is highly variable and is continually influenced by geomagnetic storms, extreme UV radiation, and planetary waves. Being able to capture this variability is essential to improve current TEC models. The growing body of data involving ionospheric fluctuations and stratospheric variations has revealed a correlation. In particular, there is a marked and persistent association between increases in stratospheric ozone and variability of the TEC. The spectral properties of ozone show that it is a greenhouse gas that alters long wave emissions from Earth and interacts with the UV spectrum coming from the sun. This study uses the Laser Environment Effects Definition and Reference (LEEDR) radiative transfer and atmospheric characterization code to model the effects of changes in stratospheric ozone on solar backscatter and longwave (LWIR) terrestrial emissions and infer TEC and TEC variability.

Paper Details

Date Published: 5 May 2017
PDF: 20 pages
Proc. SPIE 10198, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XXIII, 101980A (5 May 2017); doi: 10.1117/12.2265360
Show Author Affiliations
John S. Ross, Air Force Institute of Technology (United States)
Steven T. Fiorino, Air Force Institute of Technology (United States)


Published in SPIE Proceedings Vol. 10198:
Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XXIII
Miguel Velez-Reyes; David W. Messinger, Editor(s)

© SPIE. Terms of Use
Back to Top