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Proceedings Paper

Large-area fabrication of silicon nanostructures by templated nanoparticle arrays
Author(s): Gerry Hamdana; Maik Bertke; Tobias Südkamp; Hartmut Bracht; Hutomo Suryo Wasisto; Hutomo Suryo Wasisto; Erwin Peiner
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Paper Abstract

An improved nanoscale processing technique by using polystyrene (PS) nanoparticles as a mask is successfully implemented to produce vertically aligned silicon nanowire (SiNW) arrays. Lithographic microstructures with different shapes and opening sizes were applied to determine the fabrication area followed by deposition of a PSS/PDDA/PSS layer. Therefore, most of the substrate areas were covered and a large-range order of PS nanoparticles can be acquired by detailed investigation of spin-coating parameters and surface properties. Afterwards, the particle size was modulated resulting in feature diameters ranging from 459 ± 9 nm down to 248 ± 11 nm. Using this as a mask for inductively coupled plasma (ICP) cryogenic dry etching, a feature-size variation of high-density SiNWs from 225 ± 18 nm to 146 ± 7 nm can be achieved. Finally, a method with simple patterning steps has been developed and tested on more than 100 samples emerging as an alternative method for reliable nanostructure realization.

Paper Details

Date Published: 30 May 2017
PDF: 9 pages
Proc. SPIE 10248, Nanotechnology VIII, 1024808 (30 May 2017); doi: 10.1117/12.2264995
Show Author Affiliations
Gerry Hamdana, Technische Univ. Braunschweig (Germany)
Lab. for Emerging Nanometrology (Germany)
Maik Bertke, Technische Univ. Braunschweig (Germany)
Lab. for Emerging Nanometrology (Germany)
Tobias Südkamp, Westfälische Wilhelms-Univ. Münster (Germany)
Hartmut Bracht, Westfälische Wilhelms-Univ. Münster (Germany)
Hutomo Suryo Wasisto, Technische Univ. Braunschweig (Germany)
Lab. for Emerging Nanometrology (Germany)
Hutomo Suryo Wasisto, Technische Univ. Braunschweig (Germany)
Erwin Peiner, Technische Univ. Braunschweig (Germany)
Lab. for Emerging Nanometrology (Germany)


Published in SPIE Proceedings Vol. 10248:
Nanotechnology VIII
Ion M. Tiginyanu, Editor(s)

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