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Proceedings Paper

Evaluation of laser-electron x-ray source and related optics for x-ray diffractometry and topography
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Paper Abstract

A new type of a high-brilliance X-ray source known as the Thomson X-ray laser-electron generator (TXG) opens new possibilities for materials characterization by X-ray diffraction methods such as high resolution X-ray diffractometry and topography and diffraction analysis at extreme conditions in shear diamond anvil cells. The advantages of the TXG compared to X-ray laboratory sources are a high flux, a quasi-monochromatic, nearly parallel beam and a tunable wavelength. The paper presents examples of applications as well as estimations of typical photon flux and exposure time saving advantages resulted from an implementation of TXG radiation in a home laboratory.

Paper Details

Date Published: 17 May 2017
PDF: 8 pages
Proc. SPIE 10243, X-ray Lasers and Coherent X-ray Sources: Development and Applications, 102430Y (17 May 2017); doi: 10.1117/12.2264976
Show Author Affiliations
S. N. Polyakov, Technological Institute for Superhard and Novel Carbon Materials (Russian Federation)
I. A. Artyukov, Technological Institute for Superhard and Novel Carbon Materials (Russian Federation)
V. D. Blank, Technological Institute for Superhard and Novel Carbon Materials (Russian Federation)
S. I. Zholudev, Technological Institute for Superhard and Novel Carbon Materials (Russian Federation)
R. M. Feshchenko, P.N. Lebedev Physical Institute (Russian Federation)
N. L. Popov, P.N. Lebedev Physical Institute (Russian Federation)
A. A. Yaroslavtsev, Technological Institute for Superhard and Novel Carbon Materials (Russian Federation)
A. V. Vinogradov, P.N. Lebedev Physical Institute (Russian Federation)


Published in SPIE Proceedings Vol. 10243:
X-ray Lasers and Coherent X-ray Sources: Development and Applications
Annie Klisnick; Carmen S. Menoni, Editor(s)

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