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Proceedings Paper

High-aperture monochromator-reflectometer and its usefulness for CCD calibration
Author(s): Eugene A. Vishnyakov; Alexander V. Shcherbakov; Andrei A. Pertsov; Vladimir N. Polkovnikov; Alexey E. Pestov; Dmitry E. Pariev; Nikolai I. Chkhalo
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Paper Abstract

We present a laboratory high-aperture monochromator-reflectometer employing laser-plasma radiation source and three replaceable Schwarzschild objectives for a certain range of applications in the soft X-ray spectral waveband. Three sets of X-ray multilayer mirrors for the Schwarzschild objectives enable operation of the reflectometer at the wavelengths of 135, 171 and 304 Å, while a goniometer with three degrees of freedom allows different measurement modes. We have used the facility for a laboratory CCD calibration at the wavelengths specified. Combined with the results of the CCD sensitivity measurements conducted in the VUV spectral waveband, the total outcome provides a more comprehensive understanding of the CCD effectivity in a wide spectral range.

Paper Details

Date Published: 31 May 2017
PDF: 9 pages
Proc. SPIE 10235, EUV and X-ray Optics: Synergy between Laboratory and Space V, 102350W (31 May 2017); doi: 10.1117/12.2264814
Show Author Affiliations
Eugene A. Vishnyakov, P.N. Lebedev Physical Institute (Russian Federation)
Alexander V. Shcherbakov, Institute for Physics of Microstructures (Russian Federation)
Andrei A. Pertsov, P.N. Lebedev Physical Institute (Russian Federation)
Vladimir N. Polkovnikov, Institute for Physics of Microstructures (Russian Federation)
Alexey E. Pestov, Institute for Physics of Microstructures (Russian Federation)
Dmitry E. Pariev, Institute for Physics of Microstructures (Russian Federation)
Nikolai I. Chkhalo, Institute for Physics of Microstructures (Russian Federation)


Published in SPIE Proceedings Vol. 10235:
EUV and X-ray Optics: Synergy between Laboratory and Space V
René Hudec; Ladislav Pina, Editor(s)

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