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Proceedings Paper

Segmented-spectrum detection mechanism for medical x-ray in CdTe
Author(s): Zaifeng Shi; Qingzhen Meng; Qingjie Cao; Suying Yao
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Paper Abstract

This paper presents a segmented X-ray spectrum detection method based on a layered X-ray detector in Cadmium Telluride (CdTe) substrate. We describe the three-dimensional structure of proposed detector pixel and investigate the matched spectrum-resolving method. Polychromatic X-ray beam enter the CdTe substrate edge on and will be absorbed completely in different thickness varying with photon energy. Discrete potential wells are formed under external controlling voltage to collect the photo-electrons generated in different layers, and segmented X-ray spectrum can be deduced from the quantity of photo-electrons. In this work, we verify the feasibility of the segmented-spectrum detection mechanism by simulating the absorption of monochromatic X-ray in a CdTe substrate. Experiments in simulation show that the number of photo-electrons grow exponentially with the increase of incident thickness, and photons with different energy will be absorbed in various thickness. The charges generated in different layers are collected into adjacent potential wells, and collection efficiency is estimated to be about 87% for different incident intensity under the 40000V/cm electric field. Errors caused by charge sharing between neighboring layers are also analyzed, and it can be considered negligible by setting appropriate size of electrodes.

Paper Details

Date Published: 5 January 2017
PDF: 6 pages
Proc. SPIE 10244, International Conference on Optoelectronics and Microelectronics Technology and Application, 102440Z (5 January 2017); doi: 10.1117/12.2264512
Show Author Affiliations
Zaifeng Shi, Tianjin Univ. (China)
Tianjin Key Lab. of Imaging and Sensing Microelectronic Technology (China)
Qingzhen Meng, Tianjin Univ. (China)
Tianjin Key Lab. of Imaging and Sensing Microelectronic Technology (China)
Qingjie Cao, Tianjin Univ. (China)
Tianjin Normal Univ. (China)
Suying Yao, Tianjin Univ. (China)
Tianjin Key Lab. of Imaging and Sensing Microelectronic Technology (China)


Published in SPIE Proceedings Vol. 10244:
International Conference on Optoelectronics and Microelectronics Technology and Application
Shaohua Yu; Jose Capmany; Yi Luo; Yikai Su; Songlin Zhuang; Yue Hao; Akihiko Yoshikawa; Chongjin Xie; Yoshiaki Nakano, Editor(s)

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