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Proceedings Paper

Microwave photonic frequency down-conversion link based on intensity and phase paralleled modulation
Author(s): Jingnan Li; Yunxin Wang; Dayong Wang; Haozheng Du; Tao Zhou; Xin Zhong; Dengcai Yang; Hongli Li
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Paper Abstract

A photonic microwave down-conversion approach is proposed and experimentally demonstrated based on a Mach-Zehnder modulator paralleled with a phase modulator. The incident radio frequency signal and the local oscillator signal are feed to the MZM and PM, respectively, and these two modulated optical signals interfere in the coupler. The useless higher-order sidebands are removed by a tunable optical band-pass filter. The principle of microwave frequency down-conversion is analyzed theoretically, the MZM and PM paralleled frequency down-conversion system is built. Then the performance of system is tested, and the experimental results show that the spurious-free dynamic range achieves 104.8 dB:Hz2/3. Compared to the conventional MZM-MZM cascaded system, the SFDR has been improved by 16 dB. The MZM and PM paralleled frequency down-conversion system can balance the intensity of the two coherent beams easily, and only single DC bias is needed. The proposed method possesses simple structure and high dynamic range.

Paper Details

Date Published: 5 January 2017
PDF: 6 pages
Proc. SPIE 10244, International Conference on Optoelectronics and Microelectronics Technology and Application, 102441O (5 January 2017); doi: 10.1117/12.2264392
Show Author Affiliations
Jingnan Li, Beijing Univ. of Technology (China)
Yunxin Wang, Beijing Univ. of Technology (China)
Beijing Engineering Research Ctr. of Precision Measurement & Control Technology and Instruments (China)
Dayong Wang, Beijing Univ. of Technology (China)
Beijing Engineering Research Ctr. of Precision Measurement & Control Technology and Instruments (China)
Haozheng Du, Beijing Univ. of Technology (China)
Tao Zhou, Science and Technology on Electronic Information Control Lab. (China)
Xin Zhong, Science and Technology on Electronic Information Control Lab. (China)
Dengcai Yang, Beijing Univ. of Technology (China)
Beijing Engineering Research Ctr. of Precision Measurement & Control Technology and Instruments (China)
Hongli Li, Beijing Univ. of Technology (China)


Published in SPIE Proceedings Vol. 10244:
International Conference on Optoelectronics and Microelectronics Technology and Application
Shaohua Yu; Jose Capmany; Yi Luo; Yikai Su; Songlin Zhuang; Yue Hao; Akihiko Yoshikawa; Chongjin Xie; Yoshiaki Nakano, Editor(s)

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