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Proceedings Paper

High quantum efficiency mid-wavelength infrared superlattice photodetector
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Paper Abstract

We report high quantum efficiency (QE) MWIR barrier photodetectors based on the InAs/GaSb/AlSb type II superlattice (T2SL) material system. The nBp design consists of a single unipolar barrier (InAs/AlSb SL) placed between a 4 μm thick p-doped absorber (InAs/GaSb SL) and an n-type contact layer (InAs/GaSb SL). At 80K, the device exhibited a 50% cut-off wavelength of 5 μm, was fully turned-ON at zero bias and the measured QE was 62% (front side illumination with no AR coating) at 4.5 μm with a dark current density of 8.5×10-9 A/cm2 . At 150 K and Vb=50 mV, the 50% cut-off wavelength increased to 5.3 μm and the quantum efficiency (QE) was measured to be 64% at 4.5 μm with a dark current of 1.07×10-4 A/cm2 . The measurements were verified at multiple AFRL laboratories. The results from this device along with the analysis will be presented in this paper.

Paper Details

Date Published: 16 May 2017
PDF: 6 pages
Proc. SPIE 10177, Infrared Technology and Applications XLIII, 101771M (16 May 2017); doi: 10.1117/12.2263879
Show Author Affiliations
Alireza Kazemi, The Ohio State Univ. (United States)
Stephen Myers, SKINfrared LLC (United States)
Zahra Taghipour, The Univ. of New Mexico (United States)
Sen Mathews, The Univ. of New Mexico (United States)
Ted Schuler-Sandy, The Univ. of New Mexico (United States)
Seung Hyun Lee, The Ohio State Univ. (United States)
Vincent M. Cowan, Air Force Research Lab. (United States)
Eli Garduno, Air Force Research Lab. (United States)
Elizabeth Steenbergen, Air Force Research Lab. (United States)
Christian Morath, Air Force Research Lab. (United States)
Gamini Ariyawansa, Air Force Research Lab. (United States)
John Scheihing, Air Force Research Lab. (United States)
Sanjay Krishna, The Ohio State Univ. (United States)
SKINfrared LLC (United States)
The Univ. of New Mexico (United States)


Published in SPIE Proceedings Vol. 10177:
Infrared Technology and Applications XLIII
Bjørn F. Andresen; Gabor F. Fulop; Charles M. Hanson; John Lester Miller; Paul R. Norton, Editor(s)

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