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Proceedings Paper

Label-free hyperspectral dark-field microscopy for quantitative scatter imaging
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Paper Abstract

A hyperspectral dark-field microscope has been developed for imaging spatially distributed diffuse reflectance spectra from light-scattering samples. In this report, quantitative scatter spectroscopy is demonstrated with a uniform scattering phantom, namely a solution of polystyrene microspheres. A Monte Carlo-based inverse model was used to calculate the reduced scattering coefficients of samples of different microsphere concentrations from wavelength-dependent backscattered signal measured by the dark-field microscope. The results are compared to the measurement results from a NIST double-integrating sphere system for validation. Ongoing efforts involve quantitative mapping of scattering and absorption coefficients in samples with spatially heterogeneous optical properties.

Paper Details

Date Published: 15 March 2017
PDF: 6 pages
Proc. SPIE 10056, Design and Quality for Biomedical Technologies X, 1005602 (15 March 2017); doi: 10.1117/12.2263336
Show Author Affiliations
Philip Cheney, National Institute of Standards and Technology (United States)
David McClatchy, Thayer School of Engineering at Dartmouth (United States)
Stephen Kanick, Thayer School of Engineering at Dartmouth (United States)
Paul Lemaillet, National Institute of Standards and Technology (United States)
David Allen, National Institute of Standards and Technology (United States)
Daniel Samarov, National Institute of Standards and Technology (United States)
Brian Pogue, Thayer School of Engineering at Dartmouth (United States)
Jeeseong Hwang, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 10056:
Design and Quality for Biomedical Technologies X
Ramesh Raghavachari; Rongguang Liang, Editor(s)

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