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Proceedings Paper

Understanding the thermal sciences in the electron beam melting process through in-situ process monitoring
Author(s): J. Raplee; A. Plotkowski; M. M. Kirka; R. Dinwiddie; R. R. Dehoff; S. S. Babu
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Paper Abstract

Additive Manufacturing provides the opportunity to fabricate components of nearly limitless complexity compared to that of traditional manufacturing techniques. However, thermal gyrations imparted into the material from the passing of the heat source cause challenges in fabricating complex structures with the proper process parameters. While the thermal history of the material can be simulated, validating the simulations requires access to thermal data generated through in-situ process monitoring. While generation of in-situ thermal data seems trivial, acquiring and developing reliable calibrations for metallic materials is difficult due to the physical state of the material transitioning from powder to liquid to a solid. To be discussed is the methodology taken to integrate IR in-situ process monitoring within the electron beam melting process and the approach developed to accurately correlate a materials emissivity to temperature during the build process. Further the wealth of information contained within the thermal data will be discussed in the context of understanding of microstructural evolutions within the material during the build process, identification of material defects, and ability to determining the similarity/repeatability of builds fabricated with identical processing parameters as based only on the thermal signature of the build.

Paper Details

Date Published: 19 April 2017
PDF: 8 pages
Proc. SPIE 10169, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, and Civil Infrastructure 2017, 101690O (19 April 2017); doi: 10.1117/12.2263315
Show Author Affiliations
J. Raplee, Univ. of Tennessee (United States)
A. Plotkowski, Univ. of Tennessee (United States)
M. M. Kirka, Oak Ridge National Lab. (United States)
R. Dinwiddie, Oak Ridge National Lab. (United States)
R. R. Dehoff, Oak Ridge National Lab. (United States)
S. S. Babu, Univ. of Tennessee (United States)
Oak Ridge National Lab. (United States)


Published in SPIE Proceedings Vol. 10169:
Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, and Civil Infrastructure 2017
H. Felix Wu; Andrew L. Gyekenyesi; Peter J. Shull; Tzu-Yang Yu, Editor(s)

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