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Proceedings Paper

Adapting range migration techniques for imaging with metasurface antennas: analysis and limitations
Author(s): Laura Pulido Mancera; Thomas Fromenteze; Timothy Sleasman; Michael Boyarsky; Mohammadreza F. Imani; Matthew S. Reynolds; David R. Smith
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Paper Abstract

Dynamic metasurface antennas are planar structures that exhibit remarkable capabilities in controlling electromagnetic wave-fronts, advantages which are particularly attractive for microwave imaging. These antennas exhibit strong frequency dispersion and produce diverse radiation patterns. Such behavior presents unique challenges for integration with conventional imaging algorithms. We analyze an adapted version of the range migration algorithm (RMA) for use with dynamic metasurfaces in image reconstruction. Focusing on the the proposed pre-processing step, that ultimately allows a fast processing of the backscattered signal in the spatial frequency domain from which the fast Fourier transform can efficiently reconstruct the scene. Numerical studies illustrate imaging performance using both conventional methods and the adapted RMA, demonstrating that the RMA can reconstruct images with comparable quality in a fraction of the time. In this paper, we demonstrate the capabilities of the algorithm as a fast reconstruction tool, and we analyze the limitations of the presented technique in terms of image quality.

Paper Details

Date Published: 28 April 2017
PDF: 9 pages
Proc. SPIE 10201, Algorithms for Synthetic Aperture Radar Imagery XXIV, 102010D (28 April 2017); doi: 10.1117/12.2262906
Show Author Affiliations
Laura Pulido Mancera, Duke Univ. (United States)
Thomas Fromenteze, XLIM Research Institute (France)
Timothy Sleasman, Duke Univ. (United States)
Michael Boyarsky, Duke Univ. (United States)
Mohammadreza F. Imani, Duke Univ. (United States)
Matthew S. Reynolds, Univ. of Washington (United States)
David R. Smith, Duke Univ. (United States)


Published in SPIE Proceedings Vol. 10201:
Algorithms for Synthetic Aperture Radar Imagery XXIV
Edmund Zelnio; Frederick D. Garber, Editor(s)

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