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Proceedings Paper

Design and implementation of an electronic system to real-time capture and processing speckle interference patterns
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Paper Abstract

The design and implementation of an electronic system to real-time capture and processing speckle interference patterns is presented. Because of the random and instability speckle patterns nature, is very useful a system wich allows obtaining and visualizing interference speckle patterns in the shortest time possible. Proposed system captures the first speckle pattern as steady image while captures subsequent patterns from the same source. Images are electronically transformed separately into value arrays and subtracted to obtain real-time interference speckle patterns, these patterns are automatically archived for later analysis. System consist of a CCD camera, a computer interface that makes capturing, a transparent object and a 4f interferometric system whose source is a laser that passes through diffuser glass in order to obtain speckle effect. Experimental results and analytic explanation is showed bellow.

Paper Details

Date Published: 1 May 2017
PDF: 5 pages
Proc. SPIE 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI, 1022006 (1 May 2017); doi: 10.1117/12.2262722
Show Author Affiliations
A. Barcelata-Pinzon, Univ. Tecnológica de Puebla (Mexico)
C. Meneses-Fabian, Benemérita Univ. Autónoma de Puebla (Mexico)
R. Juarez-Salazar, Instituto Politécnico Nacional (Mexico)
J. Moreno-Guzmán, Univ. Tecnológica de Puebla (Mexico)
M. Durán-Sánchez, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
R. I. Álvarez-Tamayo, Univ. Autónoma de Nuevo Léon (Mexico)
C. Rangel-Romero, Univ. Tecnológica de Puebla (Mexico)
M. A. Navarro-Ahuatl, Univ. Tecnológica de Puebla (Mexico)


Published in SPIE Proceedings Vol. 10220:
Dimensional Optical Metrology and Inspection for Practical Applications VI
Kevin G. Harding; Song Zhang, Editor(s)

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