Share Email Print
cover

Proceedings Paper

X-ray backscatter sensing of defects in carbon fibre composite materials
Author(s): Daniel O'Flynn; Chiaki Crews; Nicholas Fox; Brian P. Allen; Mark Sammons; Robert D. Speller
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

X-ray backscatter (XBS) provides a novel approach to the field of non-destructive evaluation (NDE) in the aerospace industry. XBS is conducted by collecting the radiation which is scattered from a sample illuminated by a well-defined Xray beam, and the technique enables objects to be scanned at a sub-surface level using single-sided access, and without the requirement for coupling with the sample. Single-sided access is of particular importance when the objects of interest are very large, such as aircraft components. Carbon fibre composite materials are being increasingly used as a structural material in aircraft, and there is an increasing demand for techniques which are sensitive to the delaminations which occur in these composites as a result of both large impacts and barely visible impact damage (BVID). The XBS signal is greatly enhanced for plastics and lightweight materials, making it an ideal candidate for probing sub-surface damage and defects in carbon fibre composites. Here we present both computer modelling and experimental data which demonstrate the capability of the XBS technique for identifying hidden defects in carbon fibre.

Paper Details

Date Published: 18 May 2017
PDF: 8 pages
Proc. SPIE 10212, Advanced Photon Counting Techniques XI, 102120R (18 May 2017); doi: 10.1117/12.2262581
Show Author Affiliations
Daniel O'Flynn, Univ. College London (United Kingdom)
Chiaki Crews, Univ. College London (United Kingdom)
Nicholas Fox, Axi-Tek Ltd. (United Kingdom)
Brian P. Allen, QinetiQ Ltd. (United Kingdom)
Mark Sammons, Axi-Tek Ltd. (United Kingdom)
Robert D. Speller, Univ. College London (United Kingdom)


Published in SPIE Proceedings Vol. 10212:
Advanced Photon Counting Techniques XI
Mark A. Itzler; Joe C. Campbell, Editor(s)

© SPIE. Terms of Use
Back to Top