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Proceedings Paper

Influence of the measurement object's reflective properties on the accuracy of array projection-based 3D sensors
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Paper Abstract

In order to increase the measurement speed of pattern projection-based three-dimensional (3-D) sensors, in 2014, we introduced the so-called array projector which allows pattern projection at several 1,000 fps. As the patterns are switched by switching on and off the light sources of multiple slide projectors, each pattern originates from a different projection center. This may lead to a 3-D point deviation when measuring glossy objects. In this contribution, we theoretically and experimentally investigate the dependence of this deviation on the measurement object's reflective properties. Furthermore, we propose a procedure for compensating for this deviation.

Paper Details

Date Published: 1 May 2017
PDF: 12 pages
Proc. SPIE 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI, 1022008 (1 May 2017); doi: 10.1117/12.2262513
Show Author Affiliations
Stefan Heist, Fraunhofer IOF (Germany)
Abbe Ctr. of Photonics (Germany)
Peter Kühmstedt, Fraunhofer IOF (Germany)
Gunther Notni, Fraunhofer IOF (Germany)
Ilmenau Univ. of Technology (Germany)


Published in SPIE Proceedings Vol. 10220:
Dimensional Optical Metrology and Inspection for Practical Applications VI
Kevin G. Harding; Song Zhang, Editor(s)

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