Share Email Print
cover

Proceedings Paper

A hyperspectral scanning microscope system for phenomenology support
Author(s): Paul G. Lucey; Jessica Norman; Sarah T. Crites
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Three hyperspectral imaging systems have been implemented as microscopic hyperspectral imagers to support phenomenology studies at high spatial resolution. Wavelength ranges are VNIR (500 to 1000 nm), SWIR (1000 nm to 2500 nm) and LWIR (7 to 14 microns). The spatial resolution of the system at all wavelengths is 30 microns and covers a field of view of 8x30 mm. Samples are illuminated by rings of halogen lights and IR emitters for reflectance measurements and at thermal wavelengths can also be measured in thermal emission. Data are calibrated by scans of gold or Spectralon reflectance standards, and a flat plate blackbody for thermal emission measurements.

Paper Details

Date Published: 3 May 2017
PDF: 5 pages
Proc. SPIE 10210, Next-Generation Spectroscopic Technologies X, 102100K (3 May 2017); doi: 10.1117/12.2262421
Show Author Affiliations
Paul G. Lucey, Univ. of Hawai'i at Manoa (United States)
Jessica Norman, Univ. of Hawai'i at Manoa (United States)
Sarah T. Crites, Japan Aerospace Exploration Agency (Japan)


Published in SPIE Proceedings Vol. 10210:
Next-Generation Spectroscopic Technologies X
Mark A. Druy; Richard A. Crocombe; Steven M. Barnett; Luisa T. Profeta, Editor(s)

© SPIE. Terms of Use
Back to Top