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An interferometric sensor based on visibility modulation
Author(s): Liang Zhang; Yuanfu Lu; Yuming Dong; Guohua Jiao; Wei Chen; Jiancheng Lv
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Paper Abstract

We propose and demonstrate an interferometric sensor based on visibility modulation. In the interferometric sensor, a section of polarization maintain (PM) fiber is spliced into one arm as the sensing head. Due to the interference between the two beams in the two arms, respectively, an interferometric fringe can be obtained. The birefringence of the PM fiber splits the beam in the sensing arm, yielding a visibility envelop in the interferometric fringe. Strain applied on the PM fiber can be demodulated by measuring the visibility change in a given wavelength. Experimental result shows that the sensor can achieve resolution of up to 28 nano-strain. This demodulation scheme is immunity to the wavelength shift and power fluctuation of OSA, thus improving the accuracy of the sensor. This type of sensor can be improved by using a wavelength-swept laser or a mode-locked fiber laser.

Paper Details

Date Published: 27 April 2017
PDF: 5 pages
Proc. SPIE 10208, Fiber Optic Sensors and Applications XIV, 1020808 (27 April 2017); doi: 10.1117/12.2262411
Show Author Affiliations
Liang Zhang, Shenzhen Institutes of Advanced Technology (China)
The Chinese Univ. of Hong Kong (Hong Kong, China)
Yuanfu Lu, Shenzhen Institutes of Advanced Technology (China)
The Chinese Univ. of Hong Kong (Hong Kong, China)
Yuming Dong, Shenzhen Institutes of Advanced Technology (China)
The Chinese Univ. of Hong Kong (Hong Kong, China)
Guohua Jiao, Shenzhen Institutes of Advanced Technology (China)
The Chinese Univ. of Hong Kong (Hong Kong, China)
Wei Chen, Shenzhen Institutes of Advanced Technology (China)
The Chinese Univ. of Hong Kong (Hong Kong, China)
Jiancheng Lv, Shenzhen Institutes of Advanced Technology (China)
The Chinese Univ. of Hong Kong (Hong Kong, China)


Published in SPIE Proceedings Vol. 10208:
Fiber Optic Sensors and Applications XIV
Christopher S. Baldwin; Gary Pickrell; Henry H. Du, Editor(s)

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