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Proceedings Paper

Defect localization in museum items with traditional and electronic holographic nondestructive testing
Author(s): Vladimir B. Markov; Pierre Michel Boone; Nikolai M. Burykin; Vadim V. Ovsyannikov
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Paper Abstract

In this paper some experimental results are presented, related to practical applications of holographic nondestructive technique for inspection of museum items condition, especially in detection of deformation, stress analysis, and defects localization. These results are obtained using the basic principles of traditional double-exposure holographic interferometry as well as electronic speckle pattern interferometry with computer image processing. In the latter case the accuracy in displacement measurements was studied on a test-object. Several museum items have been selected for their condition inspection: a 19th century oil painting, an 18th century icon on wooden panel, and an enameled terra-cotta vase of the 17th century. The described technique can give quite accurate meteorological information, and is also rather promising for rapid qualitative analysis of the object condition before and after restoration, as well as during its storage.

Paper Details

Date Published: 3 November 1995
PDF: 9 pages
Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226224
Show Author Affiliations
Vladimir B. Markov, Institute of Applied Optics (Colombia)
Pierre Michel Boone, Univ. of Gent (Belgium)
Nikolai M. Burykin, Institute of Applied Optics (Ukraine)
Vadim V. Ovsyannikov, Institute of Applied Optics (Ukraine)


Published in SPIE Proceedings Vol. 2648:
International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

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