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Proceedings Paper

Wavelength dependency of optical 3D measurements at translucent objects using fringe pattern projection
Author(s): Chen Zhang; Maik Rosenberger; Andreas Breitbarth; Gunther Notni
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Paper Abstract

The requirement for a non-transparent Lambertian like surface in optical 3D measurements with fringe pattern projection cannot be satisfied at translucent objects. The translucency causes artifacts and systematic errors in the pattern decoding, which could lead to measurement errors and a decrease of measurement stability. In this work, the influence of light wavelength on 3D measurements was investigated at a stereoscopic system consisting of two filter wheel cameras with narrowband bandpass filters and a projector with a wide-band light source. The experimental results show a significant wavelength dependency of the systematic measurement deviation and the measurement stability.

Paper Details

Date Published: 1 May 2017
PDF: 8 pages
Proc. SPIE 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI, 1022007 (1 May 2017); doi: 10.1117/12.2262090
Show Author Affiliations
Chen Zhang, Technische Univ. Ilmenau (Germany)
Maik Rosenberger, Technische Univ. Ilmenau (Germany)
Andreas Breitbarth, Technische Univ. Ilmenau (Germany)
Gunther Notni, Technische Univ. Ilmenau (Germany)
Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)

Published in SPIE Proceedings Vol. 10220:
Dimensional Optical Metrology and Inspection for Practical Applications VI
Kevin G. Harding; Song Zhang, Editor(s)

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