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Proceedings Paper

Use of surface excitations in semiconductor materials for modulation of IR radiation
Author(s): Evgenie F. Venger; I. I. Burshta; A. V. Melnichuk; L. Y. Melnichuk; Y. A. Pasechnik
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Paper Abstract

We have studied the processes of modulation of infrared radiation when surface plasmon- polaritons and guided wave plasmon-polaritons are generated by the attenuated total reflectance at surfaces and in thin films of semiconductors. For these processes a comparison analysis of their characteristics was made when charge carrier concentration changed due to interaction of modulated radiation with the sample surface and bulk. It is shown how these characteristics are modified due to surface interaction.

Paper Details

Date Published: 3 November 1995
PDF: 6 pages
Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226208
Show Author Affiliations
Evgenie F. Venger, Institute of Semiconductor Physics (Ukraine)
I. I. Burshta, Institute of Semiconductor Physics (Ukraine)
A. V. Melnichuk, Institute of Semiconductor Physics (Ukraine)
L. Y. Melnichuk, Institute of Semiconductor Physics (Ukraine)
Y. A. Pasechnik, Institute of Semiconductor Physics (Ukraine)


Published in SPIE Proceedings Vol. 2648:
International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

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