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Thermal stabilization of static single-mirror Fourier transform spectrometers
Author(s): Michael Schardt; Christian Schwaller; Anton J. Tremmel; Alexander W. Koch
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Paper Abstract

Fourier transform spectroscopy has become a standard method for spectral analysis of infrared light. With this method, an interferogram is created by two beam interference which is subsequently Fourier-transformed. Most Fourier transform spectrometers used today provide the interferogram in the temporal domain. In contrast, static Fourier transform spectrometers generate interferograms in the spatial domain.

One example of this type of spectrometer is the static single-mirror Fourier transform spectrometer which offers a high etendue in combination with a simple, miniaturized optics design. As no moving parts are required, it also features a high vibration resistance and high measurement rates. However, it is susceptible to temperature variations. In this paper, we therefore discuss the main sources for temperature-induced errors in static single-mirror Fourier transform spectrometers: changes in the refractive index of the optical components used, variations of the detector sensitivity, and thermal expansion of the housing. As these errors manifest themselves in temperature-dependent wavenumber shifts and intensity shifts, they prevent static single-mirror Fourier transform spectrometers from delivering long-term stable spectra.

To eliminate these shifts, we additionally present a work concept for the thermal stabilization of the spectrometer. With this stabilization, static single-mirror Fourier transform spectrometers are made suitable for infrared process spectroscopy under harsh thermal environmental conditions. As the static single-mirror Fourier transform spectrometer uses the so-called source-doubling principle, many of the mentioned findings are transferable to other designs of static Fourier transform spectrometers based on the same principle.

Paper Details

Date Published: 5 May 2017
PDF: 8 pages
Proc. SPIE 10210, Next-Generation Spectroscopic Technologies X, 102100C (5 May 2017); doi: 10.1117/12.2261924
Show Author Affiliations
Michael Schardt, Technische Univ. München (Germany)
Christian Schwaller, Technische Univ. München (Germany)
Anton J. Tremmel, Technische Univ. München (Germany)
Alexander W. Koch, Technische Univ. München (Germany)


Published in SPIE Proceedings Vol. 10210:
Next-Generation Spectroscopic Technologies X
Mark A. Druy; Richard A. Crocombe; Steven M. Barnett; Luisa T. Profeta, Editor(s)

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