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Proceedings Paper

An INS data based approach to star image simulation for ship-borne star sensor
Author(s): Cong Sun; Hai-bo Liu; Xiao-hu Zhang; Qi-feng Yu
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Paper Abstract

The technique of the star image simulation is widely used to test star identification algorithms and the performance of star sensor on the ground. A novel INS data based approach to ship-borne star map simulation is put forward in this paper. The simulation procedure consists of three steps: Firstly, the exact speed and position of the ship in the Conventional Inertial System(CIS) are calculated via the INS data; and then the ship attitude matrix is obtained. Secondly, considering the azimuth angle and elevation angle of the star sensor, the accurate positions of the selected guide stars on the image plane of the star sensor are derived by constructing a pinhole model. At the third, the gray values of simulating star image pixels are evaluated according to the 2D Gaussian distribution law. In order to simulate the star image precisely and actually, the image smear has been considered. Based on the proposed star image simulation approach, the effects of image smear on star sensor recognition capability have been analyzed in different exposure time.

Paper Details

Date Published: 8 March 2017
PDF: 6 pages
Proc. SPIE 10255, Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016, 102552J (8 March 2017); doi: 10.1117/12.2261818
Show Author Affiliations
Cong Sun, National Univ. of Defense Technology (China)
Hunan Key Lab. of Videometrics and Vision Navigation (China)
Hai-bo Liu, National Univ. of Defense Technology (China)
Hunan Key Lab. of Videometrics and Vision Navigation (China)
Xiao-hu Zhang, National Univ. of Defense Technology (China)
Hunan Key Lab. of Videometrics and Vision Navigation (China)
Qi-feng Yu, National Univ. of Defense Technology (China)
Hunan Key Lab. of Videometrics and Vision Navigation (China)


Published in SPIE Proceedings Vol. 10255:
Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016
Yueguang Lv; Jialing Le; Hesheng Chen; Jianyu Wang; Jianda Shao, Editor(s)

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