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Proceedings Paper

Determination of profile parameters of planar waveguides
Author(s): Dmitry V. Svistunov
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Paper Abstract

The simple nondestructive method for reconstruction of the refractive index distribution in the waveguide cross section is presented. Sample surface immersing and the interferometric method of registration are utilized in this technique.

Paper Details

Date Published: 3 November 1995
PDF: 6 pages
Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226169
Show Author Affiliations
Dmitry V. Svistunov, S.I. Vavilov State Optical Institute (Russia)


Published in SPIE Proceedings Vol. 2648:
International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

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