Share Email Print
cover

Proceedings Paper

Actinic review of EUV masks: performance data and status of the AIMS EUV system
Author(s): Dirk Hellweg; Markus Koch; Sascha Perlitz; Martin Dietzel; Renzo Capelli
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The EUV mask infrastructure is of key importance for the successful introduction of EUV lithography into volume production. In particular, for the production of defect free masks an actinic review of potential defect sites is required. ZEISS and the SUNY POLY SEMATECH EUVL Mask Infrastructure consortium have developed such an EUV aerial image metrology system, the AIMS™ EUV, with the prototype tool regularly being used for customer measurement campaigns and the first system shipped to customer end of last year. In this paper, we provide an update on the system performance and present quantitative measurements of the impact of mask surface roughness on the aerial image. We show that an increasing amount of effects is only visible in actinic aerial imaging and discuss potential benefits of aerial image based mask qualification.

Paper Details

Date Published: 24 March 2017
PDF: 12 pages
Proc. SPIE 10143, Extreme Ultraviolet (EUV) Lithography VIII, 101430J (24 March 2017); doi: 10.1117/12.2261662
Show Author Affiliations
Dirk Hellweg, Carl Zeiss SMT GmbH (Germany)
Markus Koch, Carl Zeiss SMT GmbH (Germany)
Sascha Perlitz, Carl Zeiss SMT GmbH (Germany)
Martin Dietzel, Carl Zeiss SMT GmbH (Germany)
Renzo Capelli, Carl Zeiss SMT GmbH (Germany)


Published in SPIE Proceedings Vol. 10143:
Extreme Ultraviolet (EUV) Lithography VIII
Eric M. Panning, Editor(s)

© SPIE. Terms of Use
Back to Top