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Proceedings Paper

Problems of the diagnostics of waveguide of thin film and volume materials for the creation of hybrid and quasimonolithic integrated optical elements and devices
Author(s): Lyudmila I. Konopaltseva; M. I. Schuchenko; Nadezda P. Sytcheva
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Paper Abstract

Hereby theoretical peculiarities and experimental potentialities of optical waveguide diagnostics (measurement error of effective mode refractive index approximately 10-4) are reviewed, as well as elements and devices of integrated optics based on them. The special set-up, providing automatic processing of measuring information due to universality and using program library, are shown.

Paper Details

Date Published: 3 November 1995
PDF: 5 pages
Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226141
Show Author Affiliations
Lyudmila I. Konopaltseva, Scientific Research Engineering Introduction Ctr. of Priority Technologies in Optical Techniques (Ukraine)
M. I. Schuchenko, Scientific Research Engineering Introduction Ctr. of Priority Technologies in Optical Techniques (Ukraine)
Nadezda P. Sytcheva, Scientific Research Engineering Introduction Ctr. of Priority Technologies in Optical Techniques (Ukraine)


Published in SPIE Proceedings Vol. 2648:
International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

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