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Proceedings Paper

Chip-scale MOT for microsystems technology
Author(s): Argyrios Dellis; John E. Kitching
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Date Published:
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Proc. SPIE 10119, Slow Light, Fast Light, and Opto-Atomic Precision Metrology X, 1011904; doi: 10.1117/12.2261190
Show Author Affiliations
Argyrios Dellis, National Institute of Standards and Technology (United States)
John E. Kitching, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 10119:
Slow Light, Fast Light, and Opto-Atomic Precision Metrology X
Selim M. Shahriar; Jacob Scheuer, Editor(s)

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