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Proceedings Paper

Level anti-crossing magnetometry with color centers in diamond
Author(s): Huijie Zheng; Georgios Chatzidrosos; Arne Wickenbrock; Lykourgos Bougas; Reinis Lazda; Andris Berzins; Florian Helmuth Gahbauer; Marcis Auzinsh; Ruvin Ferber; Dmitry Budker
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Paper Abstract

Recent developments in magnetic field sensing with negatively charged nitrogen-vacancy centers (NV) in diamond employ magnetic-field (MF) dependent features in the photoluminescence (PL) and eliminate the need for microwaves (MW). Here, we study two approaches towards improving the magnetometric sensitivity using the ground-state level anti-crossing (GSLAC) feature of the NV center at a background MF of 102.4 mT. Following the first approach, we investigate the feature parameters for precise alignment in a dilute diamond sample; the second approach extends the sensing protocol into absorption via detection of the GSLAC in the diamond transmission of a 1042nm laser beam. This leads to an increase of GSLAC contrast and results in a magnetometer with a sensitivity of 0.45 nT/√Hz and a photon shot-noise limited sensitivity of 12.2 pT/√Hz.

Paper Details

Date Published: 20 February 2017
PDF: 8 pages
Proc. SPIE 10119, Slow Light, Fast Light, and Opto-Atomic Precision Metrology X, 101190X (20 February 2017); doi: 10.1117/12.2261160
Show Author Affiliations
Huijie Zheng, Johannes Gutenberg Univ. Mainz (Germany)
Georgios Chatzidrosos, Johannes Gutenberg Univ. Mainz (Germany)
Arne Wickenbrock, Johannes Gutenberg Univ. Mainz (Germany)
Lykourgos Bougas, Johannes Gutenberg Univ. Mainz (Germany)
Reinis Lazda, Univ. of Latvia (Latvia)
Andris Berzins, Univ. of Latvia (Latvia)
Florian Helmuth Gahbauer, Univ. of Latvia (Latvia)
Marcis Auzinsh, Univ. of Latvia (Latvia)
Ruvin Ferber, Univ. of Latvia (Latvia)
Dmitry Budker, Johannes Gutenberg Univ. Mainz (Germany)
Helmholtz-Institut Mainz (Germany)
Univ. of California, Berkeley (United States)


Published in SPIE Proceedings Vol. 10119:
Slow Light, Fast Light, and Opto-Atomic Precision Metrology X
Selim M. Shahriar; Jacob Scheuer, Editor(s)

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