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Proceedings Paper

Analysis of speckle and material properties in laider tracer
Author(s): Jacob W. Ross; Brian D. Rigling; Edward A. Watson
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Paper Abstract

The SAL simulation tool Laider Tracer models speckle: the random variation in intensity of an incident light beam across a rough surface. Within Laider Tracer, the speckle field is modeled as a 2-D array of jointly Gaussian random variables projected via ray tracing onto the scene of interest. Originally, all materials in Laider Tracer were treated as ideal diffuse scatterers, for which the far-field return computed uses the Lambertian Bidirectional Reflectance Distribution Function (BRDF). As presented here, we implement material properties into Laider Tracer via the Non-conventional Exploitation Factors Data System: a database of properties for thousands of different materials sampled at various wavelengths and incident angles. We verify the intensity behavior as a function of incident angle after material properties are added to the simulation.

Paper Details

Date Published: 28 April 2017
PDF: 10 pages
Proc. SPIE 10201, Algorithms for Synthetic Aperture Radar Imagery XXIV, 1020102 (28 April 2017); doi: 10.1117/12.2261157
Show Author Affiliations
Jacob W. Ross, Air Force Research Lab. (United States)
Brian D. Rigling, Wright State Univ. (United States)
Edward A. Watson, Univ. of Dayton Research Institute (United States)


Published in SPIE Proceedings Vol. 10201:
Algorithms for Synthetic Aperture Radar Imagery XXIV
Edmund Zelnio; Frederick D. Garber, Editor(s)

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