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Chip scale light platforms for metrology, frequency stabilization, and enhanced-light matter interactions
Author(s): Liron Stern; Meir Grajower; Jonathan Bar David; Roy Zektzer; Alex Naiman; Noa Mazurski; Uriel Levy
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Proc. SPIE 10119, Slow Light, Fast Light, and Opto-Atomic Precision Metrology X, 101191F; doi: 10.1117/12.2261127
Show Author Affiliations
Liron Stern, The Hebrew Univ. of Jerusalem (Israel)
Meir Grajower, The Hebrew Univ. of Jerusalem (Israel)
Jonathan Bar David, The Hebrew Univ. of Jerusalem (Israel)
Roy Zektzer, The Hebrew Univ. of Jerusalem (Israel)
Alex Naiman, The Hebrew Univ. of Jerusalem (Israel)
Noa Mazurski, The Hebrew Univ. of Jerusalem (Israel)
Uriel Levy, The Hebrew Univ. of Jerusalem (Israel)


Published in SPIE Proceedings Vol. 10119:
Slow Light, Fast Light, and Opto-Atomic Precision Metrology X
Selim M. Shahriar; Jacob Scheuer, Editor(s)

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