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Proceedings Paper

BRDF measurements for contamination assessment in a spacecraft environment
Author(s): Timothy L. Howard; Patricia M. Beauchamp; Robert F. Fisher
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Paper Abstract

The design of a scatterometer used for in situ studies of optical surface contamination is reviewed, and dual-wavelength (0.633, 10.6 micron) BRDF measurements are presented which were made on molecular contaminants adsorbed onto cryogenically cooled mirrors. The results are compared to others obtained from the literature, and the BRDF increase from contaminants is analyzed using a simple theory based on Rayleigh scattering.

Paper Details

Date Published: 1 November 1990
PDF: 14 pages
Proc. SPIE 1329, Optical System Contamination: Effects, Measurement, Control II, (1 November 1990); doi: 10.1117/12.22609
Show Author Affiliations
Timothy L. Howard, Aerojet ElectroSystems Co. (United States)
Patricia M. Beauchamp, Aerojet ElectroSystems Co. (United States)
Robert F. Fisher, Aerojet ElectroSystems Co. (United States)

Published in SPIE Proceedings Vol. 1329:
Optical System Contamination: Effects, Measurement, Control II
A. Peter M. Glassford, Editor(s)

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