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Proceedings Paper

JPL Molecular Contamination Investigation Facility
Author(s): Daniel M. Taylor; David M. Soules; D. Osborn
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Paper Abstract

The Jet Propulsion Laboratory (JPL) Molecular Contamination Investigation Facility (MCIF) is a new facility built to support the effort to improve the Wide Field Planetary Camera''s far-ultraviolet performance. However the MCIF is expected to produce generic data on the accumulation at low collection temperatures of outgassing products from standard spacecraft materials and components and to provide specific data for future JPL spacecraft and instruments. The MCIF comprises two independent stainless steel vacuum systems each roughed by a molecular drag pump and ultimately pumped by an ion pump. Each system contains a sample isolation chamber cell with a regulated heat exchanger (-20 to 165C) for the sample to be measured. The detection system includes a residual gas analyzer and three quartz crystal microbalances (QCM) which look back at the sample isolation chamber. Two of QCM''s are thermoelectrically controlled and heat sunk to a regulated heat exchanger the third a cryogenic QCM is heat sunk to a LN2 heat exchanger. This arrangement permits the simultaneous measurement of outgas accumulation at three pre-selected surface temperatures in the range -180 (the CQCM) or -55 (the TQCM''s) to 80C. Each system has an automatic temperature control unit and all necessary temperature sensors. There is also a computerized automatic data acquisition system for each vacuum system. The operation of the MCIF will be discussed and typical results will be presented. 2.

Paper Details

Date Published: 1 November 1990
PDF: 12 pages
Proc. SPIE 1329, Optical System Contamination: Effects, Measurement, Control II, (1 November 1990); doi: 10.1117/12.22606
Show Author Affiliations
Daniel M. Taylor, Jet Propulsion Lab. (United States)
David M. Soules, Jet Propulsion Lab. (United States)
D. Osborn, Jet Propulsion Lab. (United States)


Published in SPIE Proceedings Vol. 1329:
Optical System Contamination: Effects, Measurement, Control II
A. Peter M. Glassford, Editor(s)

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