Share Email Print
cover

Proceedings Paper

Ultrasensitive dust monitor for the Advanced X-Ray Astrophysics Facility
Author(s): Lane A. Darnton; Robert J. Champetier; Julio R. Blanco; Kevin J. Garcia
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A conceptual design and supporting analyses are presented for an in situ, on-orbit particulate-contamination monitor for the AXAF High Resolution Mirror Assembly (HRMA), a six-shell Wolter-Type-I grazing incidence telescope. The monitor technique is based on the measurement of light scattered perpendicularly from the mirror surface from a near-IR laser beam inserted into the HRMA optics spirally at grazing incidence. Results of a proof of concept experiment indicate sensitivity of scatter to the fraction of a mirror surface obscured by particles (CF) to be 0.077/sr/CF, compared with a theoretical prediction of 0.096/sr/CF. A noise-equivalent CF (NECF) of 6.2 x 10 to the -7th limited by area sampling statistics was shown to be achievable in the laboratory configuration, from which an NECF below 5 x 10 to the -7th is projected for a flight implementation of the technique. Surface illumination efficiencies of 0.63 and 0.51 for the HRMA inner paraboloid and inner hyperboloid, respectively, are shown to be achievable. The monitor design employs commonly available space qualified optical components, is low in cost, and will afford continuous monitoring of HRMA contamination levels throughout the AXAF mission, from assembly on the ground through end of life in space.

Paper Details

Date Published: 1 November 1990
PDF: 10 pages
Proc. SPIE 1329, Optical System Contamination: Effects, Measurement, Control II, (1 November 1990); doi: 10.1117/12.22604
Show Author Affiliations
Lane A. Darnton, TRW Space and Technology Group (United States)
Robert J. Champetier, EOS Technologies, Inc. (United States)
Julio R. Blanco, California State Univ./Northridge (United States)
Kevin J. Garcia, Xerox Corp. (United States)


Published in SPIE Proceedings Vol. 1329:
Optical System Contamination: Effects, Measurement, Control II
A. Peter M. Glassford, Editor(s)

© SPIE. Terms of Use
Back to Top