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Proceedings Paper

Ultrasensitive dust monitor for the Advanced X-Ray Astrophysics Facility
Author(s): Lane A. Darnton; Robert J. Champetier; Julio R. Blanco; Kevin J. Garcia
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Paper Details

Date Published: 1 November 1990
PDF: 10 pages
Proc. SPIE 1329, Optical System Contamination: Effects, Measurement, Control II, (1 November 1990); doi: 10.1117/12.22604
Show Author Affiliations
Lane A. Darnton, TRW Space and Technology Group (United States)
Robert J. Champetier, EOS Technologies, Inc. (United States)
Julio R. Blanco, California State Univ./Northridge (United States)
Kevin J. Garcia, Xerox Corp. (United States)

Published in SPIE Proceedings Vol. 1329:
Optical System Contamination: Effects, Measurement, Control II
A. Peter M. Glassford, Editor(s)

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