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Proceedings Paper

Total integrated scatter instrument for in-space monitoring of surface degradation
Author(s): J. Larry Pezzaniti; James B. Hadaway; Russell A. Chipman; Donald R. Wilkes; Lee Hummer; Jean M. Bennett
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Paper Abstract

A Total Integrated Scatter (TIS) system was built to test the viability of a TIS instrument to be used in space to monitor damage to optical and thermal control surfaces due to the low earth environment. The systems accuracy and repeatability in detecting changes in the surface quality of various space materials after exposure to atomic oxygen was tested. A method for distinguishing roughening of a surface from dust contamination is described.

Paper Details

Date Published: 1 November 1990
PDF: 11 pages
Proc. SPIE 1329, Optical System Contamination: Effects, Measurement, Control II, (1 November 1990); doi: 10.1117/12.22603
Show Author Affiliations
J. Larry Pezzaniti, Univ. of Alabama in Huntsville (United States)
James B. Hadaway, Univ. of Alabama in Huntsville (United States)
Russell A. Chipman, Univ. of Alabama in Huntsville (United States)
Donald R. Wilkes, John M. Cockerham and Associat (United States)
Lee Hummer, John M. Cockerham and Associat (United States)
Jean M. Bennett, Naval Weapons Ctr. (United States)


Published in SPIE Proceedings Vol. 1329:
Optical System Contamination: Effects, Measurement, Control II
A. Peter M. Glassford, Editor(s)

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