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Proceedings Paper

A study of irradiation side sampling flat panel detector with crystal silicon based x-ray CMOS image sensor
Author(s): MyungSoo Kim; Giyoon Kim; Yewon Kim; Jeong Tae Lee; Gyuseong Cho
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Proc. SPIE 10168, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2017, 101683N; doi: 10.1117/12.2260299
Show Author Affiliations
MyungSoo Kim, KAIST (Korea, Republic of)
Giyoon Kim, KAIST (Korea, Republic of)
Yewon Kim, KAIST (Korea, Republic of)
Jeong Tae Lee, KAIST (Korea, Republic of)
Gyuseong Cho, KAIST (Korea, Republic of)


Published in SPIE Proceedings Vol. 10168:
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2017
Jerome P. Lynch, Editor(s)

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