Share Email Print
cover

Proceedings Paper

Smart photonic coating for civil engineering field: for a future inspection technology on concrete bridge
Author(s): Hiroshi Fudouzi; Koichi Tsuchiya; Shin-ichi Todoroki; Tsuyoshi Hyakutake; Hiroyuki Nitta; Itaru Nishizaki; Yoshikazu Tanaka; Takao Ohya
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Here we will propose the conceptual new idea of the inspection of concrete bridge using smart materials and mobile IoT system. We apply opal photonic crystal film to detect cracks on concrete infrastructures. High quality opal photonic crystal films were coated on black color PET sheet over 1000 cm2 area. The opal film sheet was cut and adhered to concrete or mortar test pieces by epoxy resin. In the tensile test, the structural color of the opal sheet was changed when the crack was formed. As a demonstration, we have installated the opal film sheet on the wall of the concrete bridge. Our final purpose is the color change will be recorded by portable CCD devices, and send to expert via IoT network.

Paper Details

Date Published: 12 April 2017
PDF: 6 pages
Proc. SPIE 10168, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2017, 1016820 (12 April 2017); doi: 10.1117/12.2259822
Show Author Affiliations
Hiroshi Fudouzi, National Institute for Materials Science (Japan)
Koichi Tsuchiya, National Institute for Materials Science (Japan)
Shin-ichi Todoroki, National Institute for Materials Science (Japan)
Tsuyoshi Hyakutake, Public Works Research Institute (Japan)
Hiroyuki Nitta, Public Works Research Institute (Japan)
Itaru Nishizaki, Public Works Research Institute (Japan)
Yoshikazu Tanaka, Hiroshima Univ. (Japan)
Takao Ohya, SHO-BOND Co. (Japan)


Published in SPIE Proceedings Vol. 10168:
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2017
Jerome P. Lynch, Editor(s)

© SPIE. Terms of Use
Back to Top