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Proceedings Paper

Wafer-shape metrics based foundry lithography
Author(s): Sungtae Kim; Frida Liang; Jeffrey Mileham; Damon Tsai; Eric Bouche; Sean Lee; Albert Huang; C. F. Hua; Ming Sheng Wei
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Paper Abstract

As device shrink, there are many difficulties with process integration and device yield. Lithography process control is expected to be a major challenge due to tighter overlay and focus control requirement. The understanding and control of stresses accumulated during device fabrication has becoming more critical at advanced technology nodes. Within-wafer stress variations cause local wafer distortions which in turn present challenges for managing overlay and depth of focus during lithography. A novel technique for measuring distortion is Coherent Gradient Sensing (CGS) interferometry, which is capable of generating a high-density distortion data set of the full wafer within a time frame suitable for a high volume manufacturing (HVM) environment. In this paper, we describe the adoption of CGS (Coherent Gradient Sensing) interferometry into high volume foundry manufacturing to overcome these challenges. Leveraging this high density 3D metrology, we characterized its In-plane distortion as well as its topography capabilities applied to the full flow of an advanced foundry manufacturing. Case studies are presented that summarize the use of CGS data to reveal correlations between in-plane distortion and overlay variation as well as between topography and device yield.

Paper Details

Date Published: 28 March 2017
PDF: 10 pages
Proc. SPIE 10145, Metrology, Inspection, and Process Control for Microlithography XXXI, 101450P (28 March 2017); doi: 10.1117/12.2257799
Show Author Affiliations
Sungtae Kim, Ultratech, Inc. (United States)
Frida Liang, Ultratech, Inc. (United States)
Jeffrey Mileham, Ultratech, Inc. (United States)
Damon Tsai, Ultratech, Inc. (United States)
Eric Bouche, Ultratech, Inc. (United States)
Sean Lee, United Microelectronics Corp. (Taiwan)
Albert Huang, United Microelectronics Corp. (Taiwan)
C. F. Hua, United Microelectronics Corp. (Taiwan)
Ming Sheng Wei, United Microelectronics Corp. (Taiwan)


Published in SPIE Proceedings Vol. 10145:
Metrology, Inspection, and Process Control for Microlithography XXXI
Martha I. Sanchez, Editor(s)

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